The complexity of modern electronics systems and their behavior in harsh environments, demanding performance, fault-tolerance capabilities, and energy efficiency, proves the need to design and implement systems adaptable to applications with mixed-criticality requirements. The Extensible Reliable Offloading Solution (EROS) has been developed as a HW-based accelerator template capable of addressing these requirements. It is compatible with several RISC-V cores from the OpenHW Foundation and eases the integration of both MM accelerators and ISA extensions using CV-X-IF coprocessors. The platform offers a safety wrapper, allowing the selected core to be configured at design time and runtime in different operational modes, from single core execution to fault-tolerant operational modes such as TCLS, DCLS, and staggered. It also provides methods for error detection and recovery. The EROS solution has been implemented as a safety accelerator island in the X-HEEP system, a RISC-V microcontroller platform conceived for ultra-low power scenarios, creating the resulting X-EROS system. This demo evaluates X-EROS, which has been taped out in TSMC 65nm LP technology. The platform is evaluated through performance analysis results obtained from the execution of an AES-256-CBC algorithm. In conjunction, a controlled error injection is performed to prove the functional detection and recovery capabilities. The overall system power consumption is measured to show the different power profiles under different modes of operation, demonstrating the capacity of the platform to adapt itself not only to fault-tolerance requirements but also to low-power requirements.