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UID:pretalx-eu-summit-2026-87KRJS@cfp.riscv-europe.org
DTSTART;TZID=CET:20260610T135000
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DESCRIPTION:FPGA fault injection (FFI) is a well-known technique for verifi
 cation and robustness assessment of critical systems. However existing FFI
  tools for current generation FPGAs support only FPGA-specific fault model
 s irrelevant for ASIC prototypes\, and feature very coarse-grain analysis 
 insufficient for localization of dependability bottlenecks in the design. 
 To address these limitations have developed a bit-accurate FFI tool (BAFFI
 )\, capable of emulating ASIC (RTL) faults at the level of individual netl
 ist cells. This paper explains how BAFFI can be used to obtain robustness 
 estimates for RTL designs and exemplifies this through a case study of an 
 open-source RISC-V SoC.
DTSTAMP:20260522T163122Z
LOCATION:Poster Island A
SUMMARY:Pre-silicon Robustness Assessment of RISC-V Cores using bit-accurat
 e FPGA fault injection - Ilya Tuzov
URL:https://cfp.riscv-europe.org/eu-summit-2026/talk/87KRJS/
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